TY  - CONF
AU  - Ebert, Philipp
TI  - Cross-sectional scanning tunneling microscopy of nitride semiconductors
M1  - FZJ-2013-05572
PY  - 2013
T2  - Microscopy of Semiconductor Materials 18
CY  - 7 Apr 2013 - 11 Apr 2013, Oxford (UK)
Y2  - 7 Apr 2013 - 11 Apr 2013
M2  - Oxford, UK
LB  - PUB:(DE-HGF)6
UR  - https://juser.fz-juelich.de/record/139590
ER  -