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@INPROCEEDINGS{Ebert:139590,
      author       = {Ebert, Philipp},
      title        = {{C}ross-sectional scanning tunneling microscopy of nitride
                      semiconductors},
      reportid     = {FZJ-2013-05572},
      year         = {2013},
      month         = {Apr},
      date          = {2013-04-07},
      organization  = {Microscopy of Semiconductor Materials
                       18, Oxford (UK), 7 Apr 2013 - 11 Apr
                       2013},
      subtyp        = {Invited},
      cin          = {PGI-5},
      cid          = {I:(DE-Juel1)PGI-5-20110106},
      pnm          = {421 - Frontiers of charge based Electronics (POF2-421)},
      pid          = {G:(DE-HGF)POF2-421},
      typ          = {PUB:(DE-HGF)6},
      url          = {https://juser.fz-juelich.de/record/139590},
}