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001     139590
005     20240610115955.0
037 _ _ |a FZJ-2013-05572
041 _ _ |a English
100 1 _ |a Ebert, Philipp
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111 2 _ |a Microscopy of Semiconductor Materials 18
|c Oxford
|d 2013-04-07 - 2013-04-11
|w UK
245 _ _ |a Cross-sectional scanning tunneling microscopy of nitride semiconductors
260 _ _ |c 2013
336 7 _ |a Conference Presentation
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336 7 _ |a Conference Paper
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536 _ _ |a 421 - Frontiers of charge based Electronics (POF2-421)
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909 C O |o oai:juser.fz-juelich.de:139590
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910 1 _ |a Forschungszentrum Jülich GmbH
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981 _ _ |a I:(DE-Juel1)ER-C-1-20170209

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