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Verfahren und Elektronenmikroskop zur Messung der Ähnlichkiet zweidimensionaler Bilder



2013

Patent No.: 8,351,710; .


Note: US-amerikanische Patentanmeldung 12/310,052
Contributing Institute(s):
  1. Mikrostrukturforschung (PGI-5)
Research Program(s):
  1. 422 - Spin-based and quantum information (POF2-422) (POF2-422)
  2. 42G - Peter Grünberg-Centre (PG-C) (POF2-42G41) (POF2-42G41)

Appears in the scientific report 2013
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The record appears in these collections:
Institute Collections > ER-C > ER-C-1
Institute Collections > PGI > PGI-5
Document types > Patents > Patents
Workflow collections > Public records
Publications database
 Record created 2013-11-20, last modified 2024-06-10
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