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@ARTICLE{Alekseev:140777,
      author       = {Alekseev, P. A. and Dunaevskii, M. S. and Gushchina, E. V.
                      and Dürgün-Özben, Eylem and Lahderanta, E. and Titkov, A.
                      N.},
      title        = {{B}ehavior of locally injected charges in high-k nanolayers
                      of {L}a{S}c{O}3 insulator on a {S}i substrate},
      journal      = {Technical physics letters},
      volume       = {39},
      number       = {5},
      issn         = {1090-6533},
      address      = {Berlin},
      publisher    = {Springer Science + Business Media},
      reportid     = {FZJ-2013-06024},
      pages        = {427 - 430},
      year         = {2013},
      abstract     = {A charge leakage in LaScO3 nanolayers on a Si substrate has
                      been investigated by Kelvin probe microscopy. A charge
                      leakage from the LaScO3 layer to the LaScO3/Si interface
                      layer with a subsequent lateral charge spreading in the
                      interface layer and simultaneous leakage to the Si substrate
                      has been revealed in this system. A lateral charge spreading
                      has not been directly observed in the LaScO3 layer.},
      cin          = {PGI-9 / JARA-FIT},
      ddc          = {530},
      cid          = {I:(DE-Juel1)PGI-9-20110106 / $I:(DE-82)080009_20140620$},
      pnm          = {421 - Frontiers of charge based Electronics (POF2-421)},
      pid          = {G:(DE-HGF)POF2-421},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000320473700007},
      doi          = {10.1134/S1063785013050039},
      url          = {https://juser.fz-juelich.de/record/140777},
}