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@ARTICLE{Liu:141502,
author = {Liu, Linjie and Jin, Lei and Knoll, Lars and Wirths,
Stephan and Nichau, Alexander and Buca, Dan and Mussler,
Gregor and Holländer, Bernhard and Xu, Dawei and Feng Di,
Zeng and Zhang, Miao and Zhao, Qing-Tai and Mantl,
Siegfried},
title = {{U}ltrathin highly uniform {N}i({A}l) germanosilicide layer
with modulated {B}8 type {N}i5({S}i{G}e)3 phase formed on
strained {S}i1−x{G}ex layers},
journal = {Applied physics letters},
volume = {103},
number = {23},
issn = {0003-6951},
address = {Melville, NY},
publisher = {American Institute of Physics},
reportid = {FZJ-2013-06671},
pages = {231909 -},
year = {2013},
abstract = {We present a method to form ultrathin highly uniform Ni(Al)
germanosilicide layers oncompressively strained Si1xGex
substrates and their structural characteristics. The uniform
Ni(Al)germanosilicide film is formed with Ni/Al alloy at an
optimized temperature of 400 C withan optimized Al atomic
content of 20 $at.\%.$ We find only two kinds of grains in
the layer. Bothgrains show orthogonal relationship with
modified B8 type phase. The growth plane is identifiedto be
{10-10}-type plane. After germanosilicidation the strain in
the rest Si1xGex layer is conserved,which provides a great
advantage for device application.},
cin = {PGI-9 / PGI-5},
ddc = {530},
cid = {I:(DE-Juel1)PGI-9-20110106 / I:(DE-Juel1)PGI-5-20110106},
pnm = {421 - Frontiers of charge based Electronics (POF2-421)},
pid = {G:(DE-HGF)POF2-421},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000328634900030},
doi = {10.1063/1.4838695},
url = {https://juser.fz-juelich.de/record/141502},
}