%0 Conference Paper
%A Wiemann, Carsten
%T Photoelectron spectromicroscopy using hard x-rays to investigate resistive switching devices
%M FZJ-2013-06744
%D 2013
%B IVC
%C 9 Sep 2013 - 13 Sep 2013, Paris (Frankreich)
Y2 9 Sep 2013 - 13 Sep 2013
M2 Paris, Frankreich
%F PUB:(DE-HGF)24
%9 Poster
%U https://juser.fz-juelich.de/record/141577