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Poster (Other) FZJ-2013-06744
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Photoelectron spectromicroscopy using hard x-rays to investigate resistive switching devices



2013

IVC, ParisParis, Frankreich, 9 Sep 2013 - 13 Sep 20132013-09-092013-09-13

Contributing Institute(s):
  1. Elektronische Eigenschaften (PGI-6)
Research Program(s):
  1. 424 - Exploratory materials and phenomena (POF2-424) (POF2-424)

Appears in the scientific report 2013
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The record appears in these collections:
Document types > Presentations > Poster
Institute Collections > PGI > PGI-6
Workflow collections > Public records
Publications database
 Record created 2013-12-20, last modified 2021-01-29
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