TY  - CONF
AU  - Wiemann, Carsten
TI  - Photoelectron spectromicroscopy using hard x-rays to investigate resistive switching devices
M1  - FZJ-2013-06744
PY  - 2013
T2  - IVC
CY  - 9 Sep 2013 - 13 Sep 2013, Paris (Frankreich)
Y2  - 9 Sep 2013 - 13 Sep 2013
M2  - Paris, Frankreich
LB  - PUB:(DE-HGF)24
UR  - https://juser.fz-juelich.de/record/141577
ER  -