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001     141577
005     20210129213010.0
037 _ _ |a FZJ-2013-06744
100 1 _ |a Wiemann, Carsten
|0 P:(DE-Juel1)131035
|b 0
|u fzj
|e Corresponding author
111 2 _ |a IVC
|c Paris
|d 2013-09-09 - 2013-09-13
|w Frankreich
245 _ _ |a Photoelectron spectromicroscopy using hard x-rays to investigate resistive switching devices
260 _ _ |c 2013
336 7 _ |a Poster
|b poster
|m poster
|0 PUB:(DE-HGF)24
|s 1389169475_8148
|2 PUB:(DE-HGF)
|x Other
336 7 _ |a Conference Paper
|0 33
|2 EndNote
336 7 _ |a Output Types/Conference Poster
|2 DataCite
336 7 _ |a conferenceObject
|2 DRIVER
336 7 _ |a CONFERENCE_POSTER
|2 ORCID
336 7 _ |a INPROCEEDINGS
|2 BibTeX
536 _ _ |a 424 - Exploratory materials and phenomena (POF2-424)
|0 G:(DE-HGF)POF2-424
|c POF2-424
|x 0
|f POF II
909 C O |o oai:juser.fz-juelich.de:141577
|p VDB
910 1 _ |a Forschungszentrum Jülich GmbH
|0 I:(DE-588b)5008462-8
|k FZJ
|b 0
|6 P:(DE-Juel1)131035
913 1 _ |a DE-HGF
|b Schlüsseltechnologien
|1 G:(DE-HGF)POF2-420
|0 G:(DE-HGF)POF2-424
|2 G:(DE-HGF)POF2-400
|v Exploratory materials and phenomena
|x 0
|4 G:(DE-HGF)POF
|3 G:(DE-HGF)POF2
|l Grundlagen zukünftiger Informationstechnologien
914 1 _ |y 2013
920 1 _ |0 I:(DE-Juel1)PGI-6-20110106
|k PGI-6
|l Elektronische Eigenschaften
|x 0
980 _ _ |a poster
980 _ _ |a VDB
980 _ _ |a UNRESTRICTED
980 _ _ |a I:(DE-Juel1)PGI-6-20110106

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