Home > Publications database > High quality TbMnO3 films deposited on YAlO3 |
Journal Article | PreJuSER-14721 |
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2011
Elsevier
Lausanne
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Please use a persistent id in citations: doi:10.1016/j.jallcom.2011.03.015
Abstract: High quality thin films of TbMnO3 were grown by pulsed laser deposition on orthorhombicYAlO(3) (1 0 0). The interface and surface roughness of a 55 nm thick film were probed by X-ray reflectometry and atomic force microscopy, yielding a roughness of 1 nm. X-ray diffraction revealed untwinned films and a small mosaic spread of 0.04 degrees and 0.2 degrees for out-of-plane and in-plane reflections, respectively. This high degree of epitaxy was also confirmed by Rutherford backscattering spectrometry. Using polarized neutron diffraction we could identify a magnetic structure with the propagation vector (0 0.27 0), identical to the bulk magnetic structure of TbMnO3. (C) 2011 Elsevier B.V. All rights reserved.
Keyword(s): Basic research (1st) ; Others (1st) ; Condensed Matter Physics (2nd) ; J ; Thin films (auto) ; Multiferroics (auto) ; Transition metal oxides (auto)
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