000014721 001__ 14721 000014721 005__ 20240619090949.0 000014721 0247_ $$2DOI$$a10.1016/j.jallcom.2011.03.015 000014721 0247_ $$2WOS$$aWOS:000289372300009 000014721 0247_ $$2MLZ$$aGlavicVPSSdZB2011 000014721 037__ $$aPreJuSER-14721 000014721 041__ $$aeng 000014721 082__ $$a670 000014721 084__ $$2WoS$$aChemistry, Physical 000014721 084__ $$2WoS$$aMaterials Science, Multidisciplinary 000014721 084__ $$2WoS$$aMetallurgy & Metallurgical Engineering 000014721 1001_ $$0P:(DE-Juel1)VDB73942$$aGlavic, A.$$b0$$uFZJ 000014721 245__ $$aHigh quality TbMnO3 films deposited on YAlO3 000014721 260__ $$aLausanne$$bElsevier$$c2011 000014721 300__ $$a5061 - 5063 000014721 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article 000014721 3367_ $$2DataCite$$aOutput Types/Journal article 000014721 3367_ $$00$$2EndNote$$aJournal Article 000014721 3367_ $$2BibTeX$$aARTICLE 000014721 3367_ $$2ORCID$$aJOURNAL_ARTICLE 000014721 3367_ $$2DRIVER$$aarticle 000014721 440_0 $$03020$$aJournal of Alloys and Compounds$$v509$$x0925-8388$$y16 000014721 500__ $$aRecord converted from VDB: 12.11.2012 000014721 520__ $$aHigh quality thin films of TbMnO3 were grown by pulsed laser deposition on orthorhombicYAlO(3) (1 0 0). The interface and surface roughness of a 55 nm thick film were probed by X-ray reflectometry and atomic force microscopy, yielding a roughness of 1 nm. X-ray diffraction revealed untwinned films and a small mosaic spread of 0.04 degrees and 0.2 degrees for out-of-plane and in-plane reflections, respectively. This high degree of epitaxy was also confirmed by Rutherford backscattering spectrometry. Using polarized neutron diffraction we could identify a magnetic structure with the propagation vector (0 0.27 0), identical to the bulk magnetic structure of TbMnO3. (C) 2011 Elsevier B.V. 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