Hauptseite > Publikationsdatenbank > Chemical vapour deposition of chalcogenide phase change materials using digermane > print |
001 | 150551 | ||
005 | 20210129213218.0 | ||
020 | _ | _ | |a 978-3-89336-870-9 |
037 | _ | _ | |a FZJ-2014-00605 |
100 | 1 | _ | |a Rieß, Sally |0 P:(DE-Juel1)145686 |b 0 |e Corresponding author |
111 | 2 | _ | |a 15th European Workshop on Metalorganic Vapour Phase Epitaxie |w Germany |c Aachen |d 2013-06-02 - 2013-06-05 |g EWMOVPE XV |
245 | _ | _ | |a Chemical vapour deposition of chalcogenide phase change materials using digermane |
260 | _ | _ | |c 2013 |
300 | _ | _ | |a 277 - 280 |
336 | 7 | _ | |a Contribution to a conference proceedings |b contrib |m contrib |0 PUB:(DE-HGF)8 |s 1390465161_4175 |2 PUB:(DE-HGF) |
336 | 7 | _ | |a Conference Paper |0 33 |2 EndNote |
336 | 7 | _ | |a CONFERENCE_PAPER |2 ORCID |
336 | 7 | _ | |a Output Types/Conference Paper |2 DataCite |
336 | 7 | _ | |a conferenceObject |2 DRIVER |
336 | 7 | _ | |a INPROCEEDINGS |2 BibTeX |
500 | _ | _ | |3 POF3_Assignment on 2016-02-29 |
520 | _ | _ | |a The use of digermane (Ge2H6) as a Ge-source was investigated for the low temperature metal organic chemical
vapour deposition (MOCVD) of GexSbyTez (GST) films. Strong influence of the reactor pressure and growth
temperature on the film morphology was observed by SEM and AFM imaging. The incorporation of Ge into
the GST crystalline structure was proven using Raman scattering and XPS measurements. |
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700 | 1 | _ | |a Schlösser, Daniela |0 P:(DE-HGF)0 |b 1 |
700 | 1 | _ | |a Wiemann, Carsten |0 P:(DE-Juel1)131035 |b 2 |
700 | 1 | _ | |a Hauer, Benedikt |0 P:(DE-HGF)0 |b 3 |
700 | 1 | _ | |a Taubner, Thomas |0 P:(DE-HGF)0 |b 4 |
700 | 1 | _ | |a Stoica, Toma |0 P:(DE-Juel1)128637 |b 5 |
700 | 1 | _ | |a Grützmacher, Detlev |0 P:(DE-Juel1)125588 |b 6 |
700 | 1 | _ | |a Hardtdegen, Hilde |0 P:(DE-Juel1)125593 |b 7 |
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914 | 1 | _ | |y 2013 |
920 | _ | _ | |l yes |
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