Journal Article

FZJ-2014-04385

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Metal deposition near the tip of a scanning tunneling microscope

Divisek, J. (Corresponding Author) ; Steffen, B.FZJ* ; Stimming, U. ; Schmickler, W.

1997
Elsevier New York, NY [u.a.]

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Please use a persistent id in citations: doi:10.1016/S0022-0728(97)80053-8

Abstract: We have performed model calculations for the deposition of metal ions in the vicinity of the tip of a scanning tunneling microscope. Our results show that near the tip mass transport towards the substrate is greatly reduced. These findings may explain shielding effects that have been observed experimentally.

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Contributing Institute(s):

1. Zentralinstitut für Angewandte Mathematik (ZAM)
2. Jülich Supercomputing Center (JSC)

Research Program(s):

1. 899 - ohne Topic (POF2-899) (POF2-899)

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Database coverage:
; Current Contents - Social and Behavioral Sciences ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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