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@ARTICLE{Bittkau:16861,
author = {Bittkau, K. and Schulte, M. and Klein, M. and Beckers, T.
and Carius, R.},
title = {{M}odeling of light scattering properties from surface
profile in thin-film solar cells by {F}ourier transform
techniques},
journal = {Thin solid films},
volume = {519},
issn = {0040-6090},
address = {Amsterdam [u.a.]},
publisher = {Elsevier},
reportid = {PreJuSER-16861},
pages = {6538 - 6543},
year = {2011},
note = {Record converted from VDB: 12.11.2012},
abstract = {The optical properties of textured surfaces in the micro
and nanometer range are of interest in manifold such as
thin-film silicon photovoltaics. Light scattering models,
which are based on Fourier transform are applied to
calculate both, the angularly resolved scattering and the
haze. Therein, topography, by atomic force microscopy, and
the refractive index are used as input data. In this study,
these are applied to zinc oxide/air interfaces and to zinc
oxide/hydrogenated amorphous silicon interfaces. obtained
from zinc oxide/air interfaces are compared to the measured
scattering properties. (C) 2011 Elsevier B.V. All rights
reserved.},
keywords = {J (WoSType)},
cin = {IEK-5},
ddc = {070},
cid = {I:(DE-Juel1)IEK-5-20101013},
pnm = {Erneuerbare Energien},
pid = {G:(DE-Juel1)FUEK401},
shelfmark = {Materials Science, Multidisciplinary / Materials Science,
Coatings $\&$ Films / Physics, Applied / Physics, Condensed
Matter},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000292720000060},
doi = {10.1016/j.tsf.2011.04.122},
url = {https://juser.fz-juelich.de/record/16861},
}