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| Home > Publications database > Modeling of light scattering properties from surface profile in thin-film solar cells by Fourier transform techniques |
| Journal Article | PreJuSER-16861 |
; ; ; ;
2011
Elsevier
Amsterdam [u.a.]
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Please use a persistent id in citations: doi:10.1016/j.tsf.2011.04.122
Abstract: The optical properties of textured surfaces in the micro and nanometer range are of interest in manifold such as thin-film silicon photovoltaics. Light scattering models, which are based on Fourier transform are applied to calculate both, the angularly resolved scattering and the haze. Therein, topography, by atomic force microscopy, and the refractive index are used as input data. In this study, these are applied to zinc oxide/air interfaces and to zinc oxide/hydrogenated amorphous silicon interfaces. obtained from zinc oxide/air interfaces are compared to the measured scattering properties. (C) 2011 Elsevier B.V. All rights reserved.
Keyword(s): J ; Light scattering (auto) ; Thin-film solar cell (auto) ; Fourier transform (auto) ; Haze (auto)
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