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@ARTICLE{Schulte:16881,
      author       = {Schulte, M. and Bittkau, K. and Pieters, B. E. and Jorke,
                      S. and Stiebig, H. and Hüpkes, J. and Rau, U.},
      title        = {{R}ay tracing for the optics at nano-textured {Z}n{O}–air
                      and {Z}n{O}–silicon interfaces},
      journal      = {Progress in photovoltaics},
      volume       = {19},
      issn         = {1062-7995},
      address      = {Chichester},
      publisher    = {Wiley},
      reportid     = {PreJuSER-16881},
      pages        = {724 - 732},
      year         = {2011},
      note         = {The authors thank Thomas Beckers and Reinhard Carius for
                      the fruitful discussions and Carsten Rockstuhl for his
                      cooperation. The authors also acknowledge financial support
                      by the BMU (project number 0327625).},
      abstract     = {We investigate the scattering behavior of nano-textured
                      ZnO-Air and ZnO-Silicon interfaces for the application in
                      thin film silicon solar cells. Contrary to the common
                      approach, the numerical solution of the Maxwell's equations,
                      we introduce a ray tracing approach based on geometric
                      optics and the measured interface topography. The validity
                      of this model is discussed by means of scanning near-field
                      optical microscopy (SNOM) measurements and numerical
                      solutions of the Maxwell's equations. We show, that the ray
                      tracing model can qualitatively describe the formation of
                      micro lenses, which are the dominant feature of the local
                      scattering properties of the investigated interfaces. A
                      quantitative analysis for the ZnO-Silicon interface at
                      lambda = 488 and 780 nm shows that the ray tracing model
                      corresponds well to the numerical solution of the Maxwell's
                      equations, especially within the first 1.5 mu m distance
                      from the interface. Direct correlations between the locally
                      scattered intensity and the interface topographies are
                      found. Copyright (C) 2011 John Wiley $\&$ Sons, Ltd.},
      keywords     = {J (WoSType)},
      cin          = {IEK-5},
      ddc          = {690},
      cid          = {I:(DE-Juel1)IEK-5-20101013},
      pnm          = {Erneuerbare Energien},
      pid          = {G:(DE-Juel1)FUEK401},
      shelfmark    = {Energy $\&$ Fuels / Physics, Applied},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000294777700011},
      doi          = {10.1002/pip.1097},
      url          = {https://juser.fz-juelich.de/record/16881},
}