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@ARTICLE{Lenser:171754,
author = {Lenser, C. and Köhl, A. and Patt, M. and Schneider, C. M.
and Waser, R. and Dittmann, R.},
title = {{B}and alignment at memristive metal-oxide interfaces
investigated by hard x-ray photoemission spectroscopy},
journal = {Physical review / B},
volume = {90},
number = {11},
issn = {1098-0121},
address = {College Park, Md.},
publisher = {APS},
reportid = {FZJ-2014-05320},
pages = {115312},
year = {2014},
abstract = {The electronic structure and band alignment at metal/oxide
interfaces for nonvolatile memory applications are
investigated by hard x-ray photoelectron spectroscopy
(HAXPES) and DC transport measurements, using acceptor doped
SrTiO3 as a model memristive oxide. Metal-insulator-metal
(MIM) structures with a noble metal (Pt) top electrode form
a Schottky barrier and exhibit rectifying properties, while
a reactive metal (Ti) as top electrode shows symmetric I(V)
characteristics and a flat band situation at the interface.
The transition from rectifying to ohmic I(V) relations with
increasing Ti thickness is discussed with respect to the
electrochemical reaction at the interface, the band
alignment at the electrode/oxide interface, and the slope of
the energy bands across the MIM structure.},
cin = {PGI-7 / PGI-6},
ddc = {530},
cid = {I:(DE-Juel1)PGI-7-20110106 / I:(DE-Juel1)PGI-6-20110106},
pnm = {421 - Frontiers of charge based Electronics (POF2-421)},
pid = {G:(DE-HGF)POF2-421},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000342662600006},
doi = {10.1103/PhysRevB.90.115312},
url = {https://juser.fz-juelich.de/record/171754},
}