Journal Article

FZJ-2014-05494

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png A method for fast feature extraction in threshold scans

Mertens, M. C. (Corresponding Author) ; Ritman, J.FZJ*

2014
North-Holland Publ. Co. Amsterdam

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Please use a persistent id in citations: doi:10.1016/j.nima.2013.10.022

Abstract: We present a fast, analytical method to calculate the threshold and noise parameters from a threshold scan. This is usually done by fitting a response function to the data which is computationally very intensive. The runtime can be minimized by a hardware implementation, e.g. using an FPGA, which in turn requires to minimize the mathematical complexity of the algorithm in order to fit into the available resources on the FPGA. The systematic errors of the method are analyzed and reasonable choices of the parameters for use in practice are given.

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Contributing Institute(s):

1. Experimentelle Hadronstruktur (IKP-1)
2. JARA-FAME (JARA-FAME)

Research Program(s):

1. 531 - Hadron Structure and Dynamics (HSD) (POF2-531) (POF2-531)

Appears in the scientific report 2014

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Database coverage:
; Current Contents - Engineering, Computing and Technology ; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; NCBI Molecular Biology Database ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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