%0 Conference Paper
%A Fink, Thomas
%A Muthmann, Stefan
%A Sommer, Nicolas
%A Smeets, Michael
%A Paetzold, Ulrich W.
%A Jost, Gabrielle
%A Mück, Andreas
%A Schmitz, Ralf
%A Hülsbeck, Markus
%A Carius, Reinhard
%A Meier, Matthias
%T Influence of substrate morphology on the growth of thin-film microcrystalline silicon studied by in-situ Raman spectroscopy
%M FZJ-2014-06500
%D 2014
%B World Conference on Photovoltaic Energy Conversion
%C 23 Nov 2014 - 27 Nov 2014, Kyoto (Japan)
Y2 23 Nov 2014 - 27 Nov 2014
M2 Kyoto, Japan
%F PUB:(DE-HGF)24
%9 Poster
%U https://juser.fz-juelich.de/record/173087