Home > Publications database > Influence of substrate morphology on the growth of thin-film microcrystalline silicon studied by in-situ Raman spectroscopy
 
Poster (Other) FZJ-2014-06500
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Influence of substrate morphology on the growth of thin-film microcrystalline silicon studied by in-situ Raman spectroscopy

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2014

World Conference on Photovoltaic Energy Conversion, KyotoKyoto, Japan, 23 Nov 2014 - 27 Nov 20142014-11-232014-11-27

Contributing Institute(s):
  1. Photovoltaik (IEK-5)
Research Program(s):
  1. 111 - Thin Film Photovoltaics (POF2-111) (POF2-111)
  2. HITEC - Helmholtz Interdisciplinary Doctoral Training in Energy and Climate Research (HITEC) (HITEC-20170406) (HITEC-20170406)

Appears in the scientific report 2014
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Document types > Presentations > Poster
Institute Collections > IMD > IMD-3
Workflow collections > Public records
IEK > IEK-5
Publications database
 Record created 2014-12-03, last modified 2024-07-08
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