TY  - CONF
AU  - Fink, Thomas
AU  - Muthmann, Stefan
AU  - Sommer, Nicolas
AU  - Smeets, Michael
AU  - Paetzold, Ulrich W.
AU  - Jost, Gabrielle
AU  - Mück, Andreas
AU  - Schmitz, Ralf
AU  - Hülsbeck, Markus
AU  - Carius, Reinhard
AU  - Meier, Matthias
TI  - Influence of substrate morphology on the growth of thin-film microcrystalline silicon studied by in-situ Raman spectroscopy
M1  - FZJ-2014-06500
PY  - 2014
T2  - World Conference on Photovoltaic Energy Conversion
CY  - 23 Nov 2014 - 27 Nov 2014, Kyoto (Japan)
Y2  - 23 Nov 2014 - 27 Nov 2014
M2  - Kyoto, Japan
LB  - PUB:(DE-HGF)24
UR  - https://juser.fz-juelich.de/record/173087
ER  -