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@INPROCEEDINGS{Fink:173087,
author = {Fink, Thomas and Muthmann, Stefan and Sommer, Nicolas and
Smeets, Michael and Paetzold, Ulrich W. and Jost, Gabrielle
and Mück, Andreas and Schmitz, Ralf and Hülsbeck, Markus
and Carius, Reinhard and Meier, Matthias},
title = {{I}nfluence of substrate morphology on the growth of
thin-film microcrystalline silicon studied by in-situ
{R}aman spectroscopy},
reportid = {FZJ-2014-06500},
year = {2014},
month = {Nov},
date = {2014-11-23},
organization = {World Conference on Photovoltaic
Energy Conversion, Kyoto (Japan), 23
Nov 2014 - 27 Nov 2014},
subtyp = {Other},
cin = {IEK-5},
cid = {I:(DE-Juel1)IEK-5-20101013},
pnm = {111 - Thin Film Photovoltaics (POF2-111) / HITEC -
Helmholtz Interdisciplinary Doctoral Training in Energy and
Climate Research (HITEC) (HITEC-20170406)},
pid = {G:(DE-HGF)POF2-111 / G:(DE-Juel1)HITEC-20170406},
typ = {PUB:(DE-HGF)24},
url = {https://juser.fz-juelich.de/record/173087},
}