Home > Publications database > Investigation of the influence of the scanning probe on SNOM near-field images using rigorous simulations including the probe
 
Conference Presentation (Other) FZJ-2014-06508
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Investigation of the influence of the scanning probe on SNOM near-field images using rigorous simulations including the probe

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2014

SPIE Photonics Europe, BrusselsBrussels, Belgium, 14 Apr 2014 - 17 Apr 20142014-04-142014-04-17

Contributing Institute(s):
  1. Photovoltaik (IEK-5)
Research Program(s):
  1. 111 - Thin Film Photovoltaics (POF2-111) (POF2-111)

Appears in the scientific report 2014
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The record appears in these collections:
Document types > Presentations > Conference Presentations
Institute Collections > IMD > IMD-3
Workflow collections > Public records
IEK > IEK-5
Publications database
 Record created 2014-12-03, last modified 2024-07-08
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