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@INPROCEEDINGS{Ermes:173095,
      author       = {Ermes, Markus and Lehnen, Stephan and Bittkau, Karsten and
                      Carius, Reinhard},
      title        = {{I}nvestigation of the influence of the scanning probe on
                      {SNOM} near-field images using rigorous simulations
                      including the probe},
      reportid     = {FZJ-2014-06508},
      year         = {2014},
      month         = {Apr},
      date          = {2014-04-14},
      organization  = {SPIE Photonics Europe, Brussels
                       (Belgium), 14 Apr 2014 - 17 Apr 2014},
      subtyp        = {Other},
      cin          = {IEK-5},
      cid          = {I:(DE-Juel1)IEK-5-20101013},
      pnm          = {111 - Thin Film Photovoltaics (POF2-111)},
      pid          = {G:(DE-HGF)POF2-111},
      typ          = {PUB:(DE-HGF)6},
      url          = {https://juser.fz-juelich.de/record/173095},
}