Journal Article

PreJuSER-18276

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Proton Mobility in SiO2 Thin Films and Impact of Hydrogen and Humidity on the Resistive Switching Effect

Tappertzhofen, S.FZJ* ; Hempel, M.FZJ* ; Valov, I.FZJ* ; Waser, R.FZJ*

2011
MRS Warrendale, Pa.

This record in other databases:

Please use a persistent id in citations: doi:10.1557/opl.2011.1198

Note: Record converted from VDB: 12.11.2012

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Contributing Institute(s):

1. Elektronische Materialien (PGI-7)
2. Jülich-Aachen Research Alliance - Fundamentals of Future Information Technology (JARA-FIT)

Research Program(s):

1. Grundlagen für zukünftige Informationstechnologien (P42)

Appears in the scientific report 2011

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