Hauptseite > Publikationsdatenbank > Proton Mobility in SiO2 Thin Films and Impact of Hydrogen and Humidity on the Resistive Switching Effect > RIS |
TY - JOUR AU - Tappertzhofen, S. AU - Hempel, M. AU - Valov, I. AU - Waser, R. TI - Proton Mobility in SiO2 Thin Films and Impact of Hydrogen and Humidity on the Resistive Switching Effect JO - MRS online proceedings library VL - 1330 SN - 0272-9172 CY - Warrendale, Pa. PB - MRS M1 - PreJuSER-18276 PY - 2011 N1 - Record converted from VDB: 12.11.2012 LB - PUB:(DE-HGF)16 DO - DOI:10.1557/opl.2011.1198 UR - https://juser.fz-juelich.de/record/18276 ER -