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@ARTICLE{vandenHurk:186411,
author = {van den Hurk, Jan and Linn, Eike and Zhang, Hehe and Waser,
Rainer and Valov, Ilia},
title = {{V}olatile resistance states in electrochemical
metallization cells enabling non-destructive readout of
complementary resistive switches},
journal = {Nanotechnology},
volume = {25},
number = {42},
issn = {1361-6528},
address = {Bristol},
publisher = {IOP Publ.},
reportid = {FZJ-2015-00487},
pages = {425202 -},
year = {2014},
abstract = {Redox-based resistive memory cells exhibit changes of OFF
or intermediate resistance values over time and even ON
states can be completely lost in certain cases. The
stability of these resistance states and the time until
resistance loss strongly depends on the materials system. On
the basis of electrical measurements and chemical analysis
we found a viable explanation for these volatile resistance
states (VRSs) in Ag-GeSx-based electrochemical metallization
memory cells and identified a technological application in
the field of crossbar memories. Complementary resistive
switches usually suffer from the necessity of a destructive
read-out procedure increasing wear and reducing read-out
speed. From our analysis we deduced a solution to use the
VRS as an inherent selector mechanism without the need for
additional selector devices.},
cin = {PGI-7},
ddc = {530},
cid = {I:(DE-Juel1)PGI-7-20110106},
pnm = {421 - Frontiers of charge based Electronics (POF2-421)},
pid = {G:(DE-HGF)POF2-421},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000342580700005},
doi = {10.1088/0957-4484/25/42/425202},
url = {https://juser.fz-juelich.de/record/186411},
}