Journal Article

FZJ-2015-00661

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Correlative Studies on Sintering of Ni/BaTiO3 Multilayers Using X-ray Computed Nanotomographiy and FIB-SEM Nanotomography

Yan, Z. (Corresponding Author) ; Guillon, O. (Corresponding Author)FZJ* ; Martin, C. L. ; Wang, S. ; Lee, C.-S. ; Charlot, F. ; Bouvard, D. ; Randall, C. A.

2015
Wiley-Blackwell Oxford [u.a.]

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Please use a persistent id in citations: doi:10.1111/jace.13416

Abstract: Synchrotron X-ray computed nanotomography (nCT) and Focused Ion Beam–Scanning Electron Microscope nanotomography (FIB-nT) were used to characterize baked-out and sintered nickel (Ni) electrode–Multilayer Ceramic Capacitors. The three-dimensional microstructures obtained by two different tomography techniques were quantified and correlated. X-ray nCT is sufficient to reveal the pore characteristics, whereas the FIB-nT enables the particles in the initial packings to be identified. In the dielectric ceramic layers, pores preferentially orient horizontally in the layer and the regions near the Ni/BT interface are denser than the inner regions. This anisotropy is possibly caused by compressive stress induced during the heating stage.

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Contributing Institute(s):

1. Werkstoffsynthese und Herstellungsverfahren (IEK-1)
2. JARA-ENERGY (JARA-ENERGY)

Research Program(s):

1. 899 - ohne Topic (POF3-899) (POF3-899)

Appears in the scientific report 2015

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Database coverage:
; Current Contents - Engineering, Computing and Technology ; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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