%0 Journal Article
%A Duchamp, Martial
%A Xu, Qiang
%A Dunin-Borkowski, Rafal
%T Convenient Preparation of High-Quality Specimens for Annealing Experiments in the Transmission Electron Microscope
%J Microscopy and microanalysis
%V 20
%N 6
%@ 1431-9276
%C New York, NY
%I Cambridge University Press
%M FZJ-2015-00877
%P 1638-1645
%D 2014
%X A procedure based on focused ion beam milling and in situ lift-out is introduced for the preparation of high-quality specimens for in situ annealing experiments in the transmission electron microscope. The procedure allows an electron-transparent lamella to be cleaned directly on a heating chip using a low ion energy and back-side milling in order to minimize redeposition and damage. The approach is illustrated through the preparation of an Al–Mn–Fe complex metallic alloy specimen.
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000347233400002
%R 10.1017/S1431927614013476
%U https://juser.fz-juelich.de/record/187203