000187203 001__ 187203
000187203 005__ 20240610121121.0
000187203 0247_ $$2doi$$a10.1017/S1431927614013476
000187203 0247_ $$2WOS$$aWOS:000347233400002
000187203 037__ $$aFZJ-2015-00877
000187203 041__ $$aEnglish
000187203 082__ $$a570
000187203 1001_ $$0P:(DE-Juel1)145413$$aDuchamp, Martial$$b0$$eCorresponding Author$$ufzj
000187203 245__ $$aConvenient Preparation of High-Quality Specimens for Annealing Experiments in the Transmission Electron Microscope
000187203 260__ $$aNew York, NY$$bCambridge University Press$$c2014
000187203 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1422346617_24688
000187203 3367_ $$2DataCite$$aOutput Types/Journal article
000187203 3367_ $$00$$2EndNote$$aJournal Article
000187203 3367_ $$2BibTeX$$aARTICLE
000187203 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000187203 3367_ $$2DRIVER$$aarticle
000187203 520__ $$aA procedure based on focused ion beam milling and in situ lift-out is introduced for the preparation of high-quality specimens for in situ annealing experiments in the transmission electron microscope. The procedure allows an electron-transparent lamella to be cleaned directly on a heating chip using a low ion energy and back-side milling in order to minimize redeposition and damage. The approach is illustrated through the preparation of an Al–Mn–Fe complex metallic alloy specimen.
000187203 536__ $$0G:(DE-HGF)POF2-42G41$$a42G - Peter Grünberg-Centre (PG-C) (POF2-42G41)$$cPOF2-42G41$$fPOF II$$x0
000187203 7001_ $$0P:(DE-HGF)0$$aXu, Qiang$$b1
000187203 7001_ $$0P:(DE-Juel1)144121$$aDunin-Borkowski, Rafal$$b2$$ufzj
000187203 773__ $$0PERI:(DE-600)1481716-0$$a10.1017/S1431927614013476$$n6$$p1638-1645$$tMicroscopy and microanalysis$$v20$$x1431-9276$$y2014
000187203 8564_ $$uhttps://juser.fz-juelich.de/record/187203/files/FZJ-2015-00877.pdf$$yRestricted
000187203 909CO $$ooai:juser.fz-juelich.de:187203$$pVDB
000187203 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)145413$$aForschungszentrum Jülich GmbH$$b0$$kFZJ
000187203 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)144121$$aForschungszentrum Jülich GmbH$$b2$$kFZJ
000187203 9132_ $$0G:(DE-HGF)POF3-143$$1G:(DE-HGF)POF3-140$$2G:(DE-HGF)POF3-100$$aDE-HGF$$bForschungsbereich Energie$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Configuration-Based Phenomena$$x0
000187203 9131_ $$0G:(DE-HGF)POF2-42G41$$1G:(DE-HGF)POF2-420$$2G:(DE-HGF)POF2-400$$3G:(DE-HGF)POF2$$4G:(DE-HGF)POF$$aDE-HGF$$bSchlüsseltechnologien$$lGrundlagen zukünftiger Informationstechnologien$$vPeter Grünberg-Centre (PG-C)$$x0
000187203 9141_ $$y2014
000187203 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR
000187203 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index
000187203 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000187203 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000187203 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000187203 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000187203 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline
000187203 915__ $$0StatID:(DE-HGF)0310$$2StatID$$aDBCoverage$$bNCBI Molecular Biology Database
000187203 915__ $$0StatID:(DE-HGF)0400$$2StatID$$aAllianz-Lizenz / DFG
000187203 915__ $$0StatID:(DE-HGF)0420$$2StatID$$aNationallizenz
000187203 915__ $$0StatID:(DE-HGF)1030$$2StatID$$aDBCoverage$$bCurrent Contents - Life Sciences
000187203 915__ $$0StatID:(DE-HGF)1050$$2StatID$$aDBCoverage$$bBIOSIS Previews
000187203 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences
000187203 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF <  5
000187203 920__ $$lyes
000187203 9201_ $$0I:(DE-Juel1)PGI-5-20110106$$kPGI-5$$lMikrostrukturforschung$$x0
000187203 980__ $$ajournal
000187203 980__ $$aVDB
000187203 980__ $$aI:(DE-Juel1)PGI-5-20110106
000187203 980__ $$aUNRESTRICTED
000187203 981__ $$aI:(DE-Juel1)ER-C-1-20170209