TY  - JOUR
AU  - Duchamp, Martial
AU  - Xu, Qiang
AU  - Dunin-Borkowski, Rafal
TI  - Convenient Preparation of High-Quality Specimens for Annealing Experiments in the Transmission Electron Microscope
JO  - Microscopy and microanalysis
VL  - 20
IS  - 6
SN  - 1431-9276
CY  - New York, NY
PB  - Cambridge University Press
M1  - FZJ-2015-00877
SP  - 1638-1645
PY  - 2014
AB  - A procedure based on focused ion beam milling and in situ lift-out is introduced for the preparation of high-quality specimens for in situ annealing experiments in the transmission electron microscope. The procedure allows an electron-transparent lamella to be cleaned directly on a heating chip using a low ion energy and back-side milling in order to minimize redeposition and damage. The approach is illustrated through the preparation of an Al–Mn–Fe complex metallic alloy specimen.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000347233400002
DO  - DOI:10.1017/S1431927614013476
UR  - https://juser.fz-juelich.de/record/187203
ER  -