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@ARTICLE{Duchamp:187203,
      author       = {Duchamp, Martial and Xu, Qiang and Dunin-Borkowski, Rafal},
      title        = {{C}onvenient {P}reparation of {H}igh-{Q}uality {S}pecimens
                      for {A}nnealing {E}xperiments in the {T}ransmission
                      {E}lectron {M}icroscope},
      journal      = {Microscopy and microanalysis},
      volume       = {20},
      number       = {6},
      issn         = {1431-9276},
      address      = {New York, NY},
      publisher    = {Cambridge University Press},
      reportid     = {FZJ-2015-00877},
      pages        = {1638-1645},
      year         = {2014},
      abstract     = {A procedure based on focused ion beam milling and in situ
                      lift-out is introduced for the preparation of high-quality
                      specimens for in situ annealing experiments in the
                      transmission electron microscope. The procedure allows an
                      electron-transparent lamella to be cleaned directly on a
                      heating chip using a low ion energy and back-side milling in
                      order to minimize redeposition and damage. The approach is
                      illustrated through the preparation of an Al–Mn–Fe
                      complex metallic alloy specimen.},
      cin          = {PGI-5},
      ddc          = {570},
      cid          = {I:(DE-Juel1)PGI-5-20110106},
      pnm          = {42G - Peter Grünberg-Centre (PG-C) (POF2-42G41)},
      pid          = {G:(DE-HGF)POF2-42G41},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000347233400002},
      doi          = {10.1017/S1431927614013476},
      url          = {https://juser.fz-juelich.de/record/187203},
}