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|a Duchamp, Martial
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245 _ _ |a Convenient Preparation of High-Quality Specimens for Annealing Experiments in the Transmission Electron Microscope
260 _ _ |a New York, NY
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520 _ _ |a A procedure based on focused ion beam milling and in situ lift-out is introduced for the preparation of high-quality specimens for in situ annealing experiments in the transmission electron microscope. The procedure allows an electron-transparent lamella to be cleaned directly on a heating chip using a low ion energy and back-side milling in order to minimize redeposition and damage. The approach is illustrated through the preparation of an Al–Mn–Fe complex metallic alloy specimen.
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|a Xu, Qiang
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|a Dunin-Borkowski, Rafal
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|t Microscopy and microanalysis
|v 20
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