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@ARTICLE{Wirths:188101,
author = {Wirths, S. and Geiger, R. and von den Driesch, N. and
Mussler, G. and Stoica, T. and Mantl, S. and Ikonic, Z. and
Luysberg, M. and Chiussi, S. and Hartmann, J. M. and Sigg,
H. and Faist, J. and Buca, D. and Grützmacher, D.},
title = {{L}asing in direct-bandgap {G}e{S}n alloy grown on {S}i},
journal = {Nature photonics},
volume = {9},
number = {2},
issn = {1749-4893},
address = {London [u.a.]},
publisher = {Nature Publ. Group},
reportid = {FZJ-2015-01568},
pages = {88 - 92},
year = {2015},
abstract = {Large-scale optoelectronics integration is limited by the
inability of Si to emit light efficiently1, because Si and
the chemically well-matched Ge are indirect-bandgap
semiconductors. To overcome this drawback, several routes
have been pursued, such as the all-optical Si Raman laser2
and the heterogeneous integration of direct-bandgap III–V
lasers on Si3, 4, 5, 6, 7. Here, we report lasing in a
direct-bandgap group IV system created by alloying Ge with
Sn8 without mechanically introducing strain9, 10. Strong
enhancement of photoluminescence emerging from the direct
transition with decreasing temperature is the signature of a
fundamental direct-bandgap semiconductor. For
T ≤ 90 K, the observation of a threshold in emitted
intensity with increasing incident optical power, together
with strong linewidth narrowing and a consistent
longitudinal cavity mode pattern, highlight unambiguous
laser action11. Direct-bandgap group IV materials may thus
represent a pathway towards the monolithic integration of
Si-photonic circuitry and complementary
metal–oxide–semiconductor (CMOS) technology.},
cin = {PGI-9 / PGI-5 / JARA-FIT},
ddc = {530},
cid = {I:(DE-Juel1)PGI-9-20110106 / I:(DE-Juel1)PGI-5-20110106 /
$I:(DE-82)080009_20140620$},
pnm = {521 - Controlling Electron Charge-Based Phenomena
(POF3-521)},
pid = {G:(DE-HGF)POF3-521},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000349354300013},
doi = {10.1038/nphoton.2014.321},
url = {https://juser.fz-juelich.de/record/188101},
}