000189443 001__ 189443
000189443 005__ 20240610121207.0
000189443 0247_ $$2doi$$a10.1016/j.actamat.2013.12.035
000189443 0247_ $$2ISSN$$a1359-6454
000189443 0247_ $$2ISSN$$a1873-2453
000189443 0247_ $$2WOS$$aWOS:000333495200031
000189443 037__ $$aFZJ-2015-02610
000189443 082__ $$a670
000189443 1001_ $$0P:(DE-HGF)0$$aJeangros, Q.$$b0$$eCorresponding Author
000189443 245__ $$aOxidation mechanism of nickel particles studied in an environmental transmission electron microscope
000189443 260__ $$aAmsterdam [u.a.]$$bElsevier Science$$c2014
000189443 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1429075156_26847
000189443 3367_ $$2DataCite$$aOutput Types/Journal article
000189443 3367_ $$00$$2EndNote$$aJournal Article
000189443 3367_ $$2BibTeX$$aARTICLE
000189443 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000189443 3367_ $$2DRIVER$$aarticle
000189443 520__ $$aThe oxidation of nickel particles was studied in situ in an environmental transmission electron microscope in 3.2 mbar of O2 between ambient temperature and 600 °C. Several different transmission electron microscopy imaging techniques, electron diffraction and electron energy-loss spectroscopy were used to study the evolution of the microstructure and the local chemical composition of the particles during oxidation. Our results suggest that built-in field effects control the initial stages of oxidation, with randomly oriented NiO crystallites and internal voids then forming as a result of outward diffusion of Ni2+ along NiO grain boundaries, self-diffusion of Ni2+ ions and vacancies, growth of NiO grains and nucleation of voids at Ni/NiO interfaces. We also observed the formation of transverse cracks in a growing NiO film in situ in the electron microscope.
000189443 536__ $$0G:(DE-HGF)POF2-42G41$$a42G - Peter Grünberg-Centre (PG-C) (POF2-42G41)$$cPOF2-42G41$$fPOF II$$x0
000189443 588__ $$aDataset connected to CrossRef, juser.fz-juelich.de
000189443 7001_ $$0P:(DE-HGF)0$$aHansen, T. W.$$b1
000189443 7001_ $$0P:(DE-HGF)0$$aWagner, J. B.$$b2
000189443 7001_ $$0P:(DE-Juel1)144121$$aDunin-Borkowski, Rafal$$b3$$ufzj
000189443 7001_ $$0P:(DE-HGF)0$$aHébert, C.$$b4
000189443 7001_ $$0P:(DE-HGF)0$$aVan herle, J.$$b5
000189443 7001_ $$0P:(DE-HGF)0$$aHessler-Wyser, A.$$b6
000189443 773__ $$0PERI:(DE-600)2014621-8$$a10.1016/j.actamat.2013.12.035$$gVol. 67, p. 362 - 372$$p362 - 372$$tActa materialia$$v67$$x1359-6454$$y2014
000189443 8564_ $$uhttps://juser.fz-juelich.de/record/189443/files/1-s2.0-S1359645413009786-main.pdf$$yRestricted
000189443 8564_ $$uhttps://juser.fz-juelich.de/record/189443/files/1-s2.0-S1359645413009786-main.pdf?subformat=pdfa$$xpdfa$$yRestricted
000189443 909CO $$ooai:juser.fz-juelich.de:189443$$pVDB
000189443 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)144121$$aForschungszentrum Jülich GmbH$$b3$$kFZJ
000189443 9132_ $$0G:(DE-HGF)POF3-143$$1G:(DE-HGF)POF3-140$$2G:(DE-HGF)POF3-100$$aDE-HGF$$bForschungsbereich Energie$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Configuration-Based Phenomena$$x0
000189443 9131_ $$0G:(DE-HGF)POF2-42G41$$1G:(DE-HGF)POF2-420$$2G:(DE-HGF)POF2-400$$3G:(DE-HGF)POF2$$4G:(DE-HGF)POF$$aDE-HGF$$bSchlüsseltechnologien$$lGrundlagen zukünftiger Informationstechnologien$$vPeter Grünberg-Centre (PG-C)$$x0
000189443 9141_ $$y2014
000189443 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR
000189443 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index
000189443 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000189443 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000189443 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000189443 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000189443 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline
000189443 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences
000189443 915__ $$0StatID:(DE-HGF)1160$$2StatID$$aDBCoverage$$bCurrent Contents - Engineering, Computing and Technology
000189443 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF < 5
000189443 920__ $$lyes
000189443 9201_ $$0I:(DE-Juel1)PGI-5-20110106$$kPGI-5$$lMikrostrukturforschung$$x0
000189443 980__ $$ajournal
000189443 980__ $$aVDB
000189443 980__ $$aI:(DE-Juel1)PGI-5-20110106
000189443 980__ $$aUNRESTRICTED
000189443 981__ $$aI:(DE-Juel1)ER-C-1-20170209