Book	FZJ-2015-03166

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Scanning Probe Microscopy : Atomic Force Microscopy and Scanning Tunneling Microscopy

Voigtländer, B. (Corresponding Author)FZJ*

2015
Springer Berlin Heidelberg Berlin, Heidelberg
ISBN: 978-3-662-45239-4, 978-3-662-45240-0 (electronic)

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Contributing Institute(s):

1. Funktionale Nanostrukturen an Oberflächen (PGI-3)

Research Program(s):

1. 141 - Controlling Electron Charge-Based Phenomena (POF3-141) (POF3-141)

Appears in the scientific report 2015

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