%0 Book
%A Voigtländer, Bert
%T Scanning Probe Microscopy : Atomic Force Microscopy and Scanning Tunneling Microscopy
%C Berlin, Heidelberg
%I Springer Berlin Heidelberg
%M FZJ-2015-03166
%@ 978-3-662-45239-4
%B NanoScience and Technology
%P  
%D 2015
%F PUB:(DE-HGF)3
%9 Book
%U https://juser.fz-juelich.de/record/190248