TY  - BOOK
AU  - Voigtländer, Bert
TI  - Scanning Probe Microscopy : Atomic Force Microscopy and Scanning Tunneling Microscopy
CY  - Berlin, Heidelberg
PB  - Springer Berlin Heidelberg
M1  - FZJ-2015-03166
SN  - 978-3-662-45239-4
T2  - NanoScience and Technology
SP  -  
PY  - 2015
LB  - PUB:(DE-HGF)3
UR  - https://juser.fz-juelich.de/record/190248
ER  -