Hauptseite > Publikationsdatenbank > Scanning Probe Microscopy : Atomic Force Microscopy and Scanning Tunneling Microscopy > print

001     190248
005     20210129215538.0
020 _ _ |a 978-3-662-45239-4
020 _ _ |a 978-3-662-45240-0 (electronic)
024 7 _ |a altmetric:6629457
|2 altmetric
037 _ _ |a FZJ-2015-03166
100 1 _ |a Voigtländer, Bert
|0 P:(DE-Juel1)128794
|b 0
|e Corresponding Author
|u fzj
245 _ _ |a Scanning Probe Microscopy : Atomic Force Microscopy and Scanning Tunneling Microscopy
260 _ _ |a Berlin, Heidelberg
|c 2015
|b Springer Berlin Heidelberg
300 _ _ |a
336 7 _ |a Book
|b book
|m book
|0 PUB:(DE-HGF)3
|s 1431500157_3597
|2 PUB:(DE-HGF)
336 7 _ |a book
|2 DRIVER
336 7 _ |a Book
|0 1
|2 EndNote
336 7 _ |a Output Types/Book
|2 DataCite
336 7 _ |a BOOK
|2 ORCID
336 7 _ |a BOOK
|2 BibTeX
490 0 _ |a NanoScience and Technology
536 _ _ |a 141 - Controlling Electron Charge-Based Phenomena (POF3-141)
|0 G:(DE-HGF)POF3-141
|c POF3-141
|x 0
|f POF III
588 _ _ |a Dataset connected to CrossRef Book, juser.fz-juelich.de
773 _ _ |y 2015
909 C O |o oai:juser.fz-juelich.de:190248
|p VDB
910 1 _ |a Forschungszentrum Jülich GmbH
|0 I:(DE-588b)5008462-8
|k FZJ
|b 0
|6 P:(DE-Juel1)128794
913 0 _ |a DE-HGF
|b Schlüsseltechnologien
|l Grundlagen für zukünftige Informationstechnologien
|1 G:(DE-HGF)POF2-420
|0 G:(DE-HGF)POF2-421
|2 G:(DE-HGF)POF2-400
|v Frontiers of charge based Electronics
|x 0
913 1 _ |a DE-HGF
|l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)
|1 G:(DE-HGF)POF3-140
|0 G:(DE-HGF)POF3-141
|2 G:(DE-HGF)POF3-100
|v Controlling Electron Charge-Based Phenomena
|x 0
|4 G:(DE-HGF)POF
|3 G:(DE-HGF)POF3
|b Energie
914 1 _ |y 2015
920 1 _ |0 I:(DE-Juel1)PGI-3-20110106
|k PGI-3
|l Funktionale Nanostrukturen an Oberflächen
|x 0
980 _ _ |a book
980 _ _ |a VDB
980 _ _ |a I:(DE-Juel1)PGI-3-20110106
980 _ _ |a UNRESTRICTED

LibraryCollectionCLSMajorCLSMinorLanguageAuthor
Marc 21