%0 Journal Article
%A Kichin, Georgy
%A Wagner, C.
%A Tautz, Frank Stefan
%A Temirov, R.
%T Calibrating atomic-scale force sensors installed at the tip apex of a scanning tunneling microscope
%J Physical review / B
%V 87
%N 8
%@ 1098-0121
%C College Park, Md.
%I APS
%M FZJ-2015-03342
%P 081408
%D 2013
%X Scanning tunneling microscopy (STM) tips decorated with either a single carbon monoxide molecule or a single xenon atom are characterized by simultaneous force and conductance measurements using a combined low-temperature noncontact atomic force and scanning tunneling microscope (NC-AFM/STM). It is shown that in both cases the particle decorating the tip simultaneously performs the function of an atomic-scale force sensor and transducer which couples the short-range force acting on the tip to the tunneling conductance of the junction. On the basis of the experimental data, two distinct coupling regimes are identified; in one of them the force sensor-transducer function is calibrated quantitatively.
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000315278000001
%R 10.1103/PhysRevB.87.081408
%U https://juser.fz-juelich.de/record/201032