Journal Article

FZJ-2015-03342

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Calibrating atomic-scale force sensors installed at the tip apex of a scanning tunneling microscope

Kichin, G.FZJ* ; Wagner, C.FZJ* ; Tautz, F. S.FZJ* ; Temirov, R. (Corresponding Author)FZJ*

2013
APS College Park, Md.

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Please use a persistent id in citations: http://hdl.handle.net/2128/8726  doi:10.1103/PhysRevB.87.081408

Abstract: Scanning tunneling microscopy (STM) tips decorated with either a single carbon monoxide molecule or a single xenon atom are characterized by simultaneous force and conductance measurements using a combined low-temperature noncontact atomic force and scanning tunneling microscope (NC-AFM/STM). It is shown that in both cases the particle decorating the tip simultaneously performs the function of an atomic-scale force sensor and transducer which couples the short-range force acting on the tip to the tunneling conductance of the junction. On the basis of the experimental data, two distinct coupling regimes are identified; in one of them the force sensor-transducer function is calibrated quantitatively.

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Contributing Institute(s):

1. Funktionale Nanostrukturen an Oberflächen (PGI-3)

Research Program(s):

1. 422 - Spin-based and quantum information (POF2-422) (POF2-422)

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Database coverage:
; ; ; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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