Hauptseite > Publikationsdatenbank > Calibrating atomic-scale force sensors installed at the tip apex of a scanning tunneling microscope > print |
001 | 201032 | ||
005 | 20230426083121.0 | ||
024 | 7 | _ | |2 doi |a 10.1103/PhysRevB.87.081408 |
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100 | 1 | _ | |0 P:(DE-Juel1)142197 |a Kichin, Georgy |b 0 |
245 | _ | _ | |a Calibrating atomic-scale force sensors installed at the tip apex of a scanning tunneling microscope |
260 | _ | _ | |a College Park, Md. |b APS |c 2013 |
336 | 7 | _ | |0 PUB:(DE-HGF)16 |2 PUB:(DE-HGF) |a Journal Article |b journal |m journal |s 1433913920_12150 |
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520 | _ | _ | |a Scanning tunneling microscopy (STM) tips decorated with either a single carbon monoxide molecule or a single xenon atom are characterized by simultaneous force and conductance measurements using a combined low-temperature noncontact atomic force and scanning tunneling microscope (NC-AFM/STM). It is shown that in both cases the particle decorating the tip simultaneously performs the function of an atomic-scale force sensor and transducer which couples the short-range force acting on the tip to the tunneling conductance of the junction. On the basis of the experimental data, two distinct coupling regimes are identified; in one of them the force sensor-transducer function is calibrated quantitatively. |
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700 | 1 | _ | |0 P:(DE-Juel1)140276 |a Wagner, C. |b 1 |
700 | 1 | _ | |0 P:(DE-Juel1)128791 |a Tautz, Frank Stefan |b 2 |u fzj |
700 | 1 | _ | |0 P:(DE-Juel1)128792 |a Temirov, R. |b 3 |e Corresponding Author |
773 | 1 | 8 | |a 10.1103/physrevb.87.081408 |b American Physical Society (APS) |d 2013-02-22 |n 8 |p 081408 |3 journal-article |2 Crossref |t Physical Review B |v 87 |y 2013 |x 1098-0121 |
773 | _ | _ | |a 10.1103/PhysRevB.87.081408 |g Vol. 87, no. 8, p. 081408 |0 PERI:(DE-600)2844160-6 |n 8 |p 081408 |t Physical review / B |v 87 |y 2013 |x 1098-0121 |
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