000201893 001__ 201893
000201893 005__ 20210129215939.0
000201893 0247_ $$2doi$$a10.1149/1.3534833
000201893 0247_ $$2ISSN$$a1099-0062
000201893 0247_ $$2ISSN$$a1944-8775
000201893 0247_ $$2WOS$$aWOS:000287408700014
000201893 037__ $$aFZJ-2015-04183
000201893 082__ $$a540
000201893 1001_ $$0P:(DE-HGF)0$$aKim, Seong Keun$$b0$$eCorresponding Author
000201893 245__ $$aHigh Growth Rate in Atomic Layer Deposition of TiO$_{2}$ thin films by UV Irradiation
000201893 260__ $$aPennington, NJ$$bSoc.$$c2011
000201893 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1435647199_1776
000201893 3367_ $$2DataCite$$aOutput Types/Journal article
000201893 3367_ $$00$$2EndNote$$aJournal Article
000201893 3367_ $$2BibTeX$$aARTICLE
000201893 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000201893 3367_ $$2DRIVER$$aarticle
000201893 520__ $$aThe exposure effect of the reaction surface to ultraviolet (UV) light was studied for atomic layer deposition (ALD) of TiO2 films from Ti(OiPr)4 and H2O at 260°C. UV light was irradiated on the reaction surface after the purge step of Ti-precursor and oxygen source, respectively. UV irradiation on the reaction surface resulted in a higher growth rate of the TiO2 films compared to the thermal ALD. The growth rate of anatase TiO2 increased by a factor of 2 to about 0.25 nm/cycle while the surface roughness was reduced. UV-light induced increase of the number of chemisorption sites is discussed as the possible mechanism.
000201893 536__ $$0G:(DE-HGF)POF2-424$$a424 - Exploratory materials and phenomena (POF2-424)$$cPOF2-424$$fPOF II$$x0
000201893 588__ $$aDataset connected to CrossRef, juser.fz-juelich.de
000201893 7001_ $$0P:(DE-Juel1)130717$$aHoffmann-Eifert, Susanne$$b1
000201893 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b2$$ufzj
000201893 773__ $$0PERI:(DE-600)1483551-4$$a10.1149/1.3534833$$gVol. 14, no. 4, p. H146 -$$n4$$pH146 -$$tElectrochemical and solid-state letters$$v14$$x1099-0062$$y2011
000201893 8564_ $$uhttps://juser.fz-juelich.de/record/201893/files/Electrochem.%20Solid-State%20Lett.-2011-Kim-H146-8.pdf$$yRestricted
000201893 8564_ $$uhttps://juser.fz-juelich.de/record/201893/files/Electrochem.%20Solid-State%20Lett.-2011-Kim-H146-8.gif?subformat=icon$$xicon$$yRestricted
000201893 8564_ $$uhttps://juser.fz-juelich.de/record/201893/files/Electrochem.%20Solid-State%20Lett.-2011-Kim-H146-8.jpg?subformat=icon-1440$$xicon-1440$$yRestricted
000201893 8564_ $$uhttps://juser.fz-juelich.de/record/201893/files/Electrochem.%20Solid-State%20Lett.-2011-Kim-H146-8.jpg?subformat=icon-180$$xicon-180$$yRestricted
000201893 8564_ $$uhttps://juser.fz-juelich.de/record/201893/files/Electrochem.%20Solid-State%20Lett.-2011-Kim-H146-8.jpg?subformat=icon-640$$xicon-640$$yRestricted
000201893 8564_ $$uhttps://juser.fz-juelich.de/record/201893/files/Electrochem.%20Solid-State%20Lett.-2011-Kim-H146-8.pdf?subformat=pdfa$$xpdfa$$yRestricted
000201893 909CO $$ooai:juser.fz-juelich.de:201893$$pVDB
000201893 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130717$$aForschungszentrum Jülich GmbH$$b1$$kFZJ
000201893 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)131022$$aForschungszentrum Jülich GmbH$$b2$$kFZJ
000201893 9132_ $$0G:(DE-HGF)POF3-524$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Collective States$$x0
000201893 9131_ $$0G:(DE-HGF)POF2-424$$1G:(DE-HGF)POF2-420$$2G:(DE-HGF)POF2-400$$3G:(DE-HGF)POF2$$4G:(DE-HGF)POF$$aDE-HGF$$bSchlüsseltechnologien$$lGrundlagen zukünftiger Informationstechnologien$$vExploratory materials and phenomena$$x0
000201893 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR
000201893 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000201893 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000201893 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000201893 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF < 5
000201893 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0
000201893 9201_ $$0I:(DE-82)080009_20140620$$kJARA-FIT$$lJARA-FIT$$x1
000201893 980__ $$ajournal
000201893 980__ $$aVDB
000201893 980__ $$aI:(DE-Juel1)PGI-7-20110106
000201893 980__ $$aI:(DE-82)080009_20140620
000201893 980__ $$aUNRESTRICTED