%0 Journal Article
%A Ananyev, M. V.
%A Bronin, D. I.
%A Osinkin, D. A.
%A Eremin, V. A.
%A Steinberger-Wilckens, R.
%A de Haart, L.G.J.
%A Mertens, Josef
%T Characterization of Ni-cermet degradation phenomena I. Long termresistivity monitoring, image processing and X-ray fluorescenceanalysis
%J Journal of power sources
%V 286
%@ 0378-7753
%C New York, NY [u.a.]
%I Elsevier
%M FZJ-2015-04517
%P 414 - 426
%D 2015
%X The present paper is devoted to Ni-cermet degradation phenomena and places emphasis on experimental approaches and data handling. The resistivity of Ni-YSZ cermet (nickel and 8 mol.% yttria stabilized zirconia) anode substrates was monitored during 3000 h at 700 and 800 °C in a gas mixture of 80 vol.% water vapor and 20 vol.% hydrogen. The experimentally evaluated dependence of resistivity of the Ni-YSZ substrates can be well described by exponential decay functions. Post test analysis by image processing and XRF (X-ray fluorescence) analysis for characterization of the microstructure and elemental composition were carried out for virgin samples and after 300, 1000 and 3000 h of exposure time. The 3D-microstructure was reconstructed using an original spheres packing algorithm. Two processes leading to the Ni-YSZ degradation were observed: Ni-phase particle coarsening and volatilization. The effect of these processes on resistivity and such microstructure parameters as porosity, Ni-phase fraction, Ni and YSZ phases particle size distributions, triple phase boundary length, and tortuosity factor are considered in this paper.
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000355027400048
%R 10.1016/j.jpowsour.2015.03.168
%U https://juser.fz-juelich.de/record/202228