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000202228 1001_ $$0P:(DE-HGF)0$$aAnanyev, M. V.$$b0$$eCorresponding Author
000202228 245__ $$aCharacterization of Ni-cermet degradation phenomena I. Long termresistivity monitoring, image processing and X-ray fluorescenceanalysis
000202228 260__ $$aNew York, NY [u.a.]$$bElsevier$$c2015
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000202228 520__ $$aThe present paper is devoted to Ni-cermet degradation phenomena and places emphasis on experimental approaches and data handling. The resistivity of Ni-YSZ cermet (nickel and 8 mol.% yttria stabilized zirconia) anode substrates was monitored during 3000 h at 700 and 800 °C in a gas mixture of 80 vol.% water vapor and 20 vol.% hydrogen. The experimentally evaluated dependence of resistivity of the Ni-YSZ substrates can be well described by exponential decay functions. Post test analysis by image processing and XRF (X-ray fluorescence) analysis for characterization of the microstructure and elemental composition were carried out for virgin samples and after 300, 1000 and 3000 h of exposure time. The 3D-microstructure was reconstructed using an original spheres packing algorithm. Two processes leading to the Ni-YSZ degradation were observed: Ni-phase particle coarsening and volatilization. The effect of these processes on resistivity and such microstructure parameters as porosity, Ni-phase fraction, Ni and YSZ phases particle size distributions, triple phase boundary length, and tortuosity factor are considered in this paper.
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000202228 7001_ $$0P:(DE-HGF)0$$aBronin, D. I.$$b1
000202228 7001_ $$0P:(DE-HGF)0$$aOsinkin, D. A.$$b2
000202228 7001_ $$0P:(DE-HGF)0$$aEremin, V. A.$$b3
000202228 7001_ $$0P:(DE-HGF)0$$aSteinberger-Wilckens, R.$$b4
000202228 7001_ $$0P:(DE-Juel1)129952$$ade Haart, L.G.J.$$b5$$ufzj
000202228 7001_ $$0P:(DE-Juel1)130445$$aMertens, Josef$$b6$$ufzj
000202228 773__ $$0PERI:(DE-600)1491915-1$$a10.1016/j.jpowsour.2015.03.168$$gVol. 286, p. 414 - 426$$p414 - 426$$tJournal of power sources$$v286$$x0378-7753$$y2015
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