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| Home > Publications database > Characterization of Ni-cermet degradation phenomena I. Long termresistivity monitoring, image processing and X-ray fluorescenceanalysis > print |
| 001 | 202228 | ||
| 005 | 20240712112833.0 | ||
| 024 | 7 | _ | |a 10.1016/j.jpowsour.2015.03.168 |2 doi |
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| 100 | 1 | _ | |a Ananyev, M. V. |0 P:(DE-HGF)0 |b 0 |e Corresponding Author |
| 245 | _ | _ | |a Characterization of Ni-cermet degradation phenomena I. Long termresistivity monitoring, image processing and X-ray fluorescenceanalysis |
| 260 | _ | _ | |a New York, NY [u.a.] |c 2015 |b Elsevier |
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| 520 | _ | _ | |a The present paper is devoted to Ni-cermet degradation phenomena and places emphasis on experimental approaches and data handling. The resistivity of Ni-YSZ cermet (nickel and 8 mol.% yttria stabilized zirconia) anode substrates was monitored during 3000 h at 700 and 800 °C in a gas mixture of 80 vol.% water vapor and 20 vol.% hydrogen. The experimentally evaluated dependence of resistivity of the Ni-YSZ substrates can be well described by exponential decay functions. Post test analysis by image processing and XRF (X-ray fluorescence) analysis for characterization of the microstructure and elemental composition were carried out for virgin samples and after 300, 1000 and 3000 h of exposure time. The 3D-microstructure was reconstructed using an original spheres packing algorithm. Two processes leading to the Ni-YSZ degradation were observed: Ni-phase particle coarsening and volatilization. The effect of these processes on resistivity and such microstructure parameters as porosity, Ni-phase fraction, Ni and YSZ phases particle size distributions, triple phase boundary length, and tortuosity factor are considered in this paper. |
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| 700 | 1 | _ | |a Eremin, V. A. |0 P:(DE-HGF)0 |b 3 |
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| 773 | _ | _ | |a 10.1016/j.jpowsour.2015.03.168 |g Vol. 286, p. 414 - 426 |0 PERI:(DE-600)1491915-1 |p 414 - 426 |t Journal of power sources |v 286 |y 2015 |x 0378-7753 |
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