Journal Article

FZJ-2015-04624

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Label-Free Measurement of Cell–Electrode Cleft Gap Distance with High Spatial Resolution Surface Plasmon Microscopy

Toma, K. (Corresponding Author)FZJ* ; Kano, H. ; Offenhäusser, A.FZJ*

2014
Soc. Washington, DC

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Please use a persistent id in citations: doi:10.1021/nn505521e

Abstract: Understanding the interface between cells or tissues and artificial materials is of critical importance for a broad range of areas. For example, in neurotechnology, the interfaces between neurons and external devices create a link between technical and the nervous systems by stimulating or recording from neural tissue. Here, a more effective interface is required to enhance the electrical characteristics of neuronal recordings and stimulations. Up to now, the lack of a systematic characterization of cell–electrode interaction turns out to be the major bottleneck. In this work, we employed a recently developed surface plasmon microscope (SPM) to monitor in real-time the cell–metal interface and to measure in situ the gap distance of the cleft with the spatial resolution reaching to the optical diffraction limit. The SPM allowed determination of the distance of human embryonic kidney 293 cells cultured on gold surfaces coated with various peptides or proteins without any labeling. This method can dramatically simplify the interaction investigation at metal–living cell interface and should be incorporated into systematic characterization methods.

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Contributing Institute(s):

1. Bioelektronik (ICS-8)
2. Bioelektronik (PGI-8)

Research Program(s):

1. 523 - Controlling Configuration-Based Phenomena (POF3-523) (POF3-523)

Appears in the scientific report 2015

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Database coverage:
; Current Contents - Physical, Chemical and Earth Sciences ; IF >= 10 ; JCR ; NCBI Molecular Biology Database ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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