000202816 001__ 202816
000202816 005__ 20240711101426.0
000202816 0247_ $$2doi$$a10.1016/j.ssi.2014.09.012
000202816 0247_ $$2ISSN$$a0167-2738
000202816 0247_ $$2ISSN$$a1872-7689
000202816 0247_ $$2WOS$$aWOS:000353929000002
000202816 037__ $$aFZJ-2015-04977
000202816 082__ $$a530
000202816 1001_ $$0P:(DE-Juel1)145202$$aKeppner, Johannes$$b0$$ufzj
000202816 245__ $$aXRD analysis of strain states in epitaxial YSZ/RE2O3 (RE=Y, Er) multilayers as a function of layer thickness
000202816 260__ $$aAmsterdam [u.a.]$$bElsevier Science$$c2015
000202816 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1437480944_27743
000202816 3367_ $$2DataCite$$aOutput Types/Journal article
000202816 3367_ $$00$$2EndNote$$aJournal Article
000202816 3367_ $$2BibTeX$$aARTICLE
000202816 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000202816 3367_ $$2DRIVER$$aarticle
000202816 520__ $$aThe strain in epitaxialmultilayerswith coherent interfaces between yttria stabilized zirconia and rare earth metaloxides is investigated as a function of the layer thickness. An analyticmodel was developed to describe the strain,which is analyzed bymeasuring distinct XRD reflections in two orientations. Applying our model to this data theinterface thickness δ0 is estimated. For Y2O3/YSZ multilayers δ0 is 9.3 nm and for Er2O3/YSZ multilayers δ0 is8.2 nm. Our findings are in accordance with the assumption that mismatch induced stress can be relaxed byelastic deformation
000202816 536__ $$0G:(DE-HGF)POF3-521$$a521 - Controlling Electron Charge-Based Phenomena (POF3-521)$$cPOF3-521$$fPOF III$$x0
000202816 588__ $$aDataset connected to CrossRef
000202816 7001_ $$0P:(DE-Juel1)140525$$aKorte, Carsten$$b1$$eCorresponding author$$ufzj
000202816 7001_ $$0P:(DE-Juel1)128631$$aSchubert, Jürgen$$b2
000202816 7001_ $$0P:(DE-Juel1)128648$$aZander, Willi$$b3$$ufzj
000202816 7001_ $$0P:(DE-Juel1)129815$$aZiegner, Mirko$$b4$$ufzj
000202816 7001_ $$0P:(DE-Juel1)129928$$aStolten, Detlef$$b5$$ufzj
000202816 773__ $$0PERI:(DE-600)1500750-9$$a10.1016/j.ssi.2014.09.012$$gVol. 273, p. 2 - 7$$p2 - 7$$tSolid state ionics$$v273$$x0167-2738$$y2015
000202816 8564_ $$uhttp://www.sciencedirect.com/science/article/pii/S0167273814003695
000202816 8564_ $$uhttps://juser.fz-juelich.de/record/202816/files/1-s2.0-S0167273814003695-main%281%29.pdf$$yRestricted
000202816 8564_ $$uhttps://juser.fz-juelich.de/record/202816/files/1-s2.0-S0167273814003695-main%281%29.gif?subformat=icon$$xicon$$yRestricted
000202816 8564_ $$uhttps://juser.fz-juelich.de/record/202816/files/1-s2.0-S0167273814003695-main%281%29.jpg?subformat=icon-1440$$xicon-1440$$yRestricted
000202816 8564_ $$uhttps://juser.fz-juelich.de/record/202816/files/1-s2.0-S0167273814003695-main%281%29.jpg?subformat=icon-180$$xicon-180$$yRestricted
000202816 8564_ $$uhttps://juser.fz-juelich.de/record/202816/files/1-s2.0-S0167273814003695-main%281%29.jpg?subformat=icon-640$$xicon-640$$yRestricted
000202816 8564_ $$uhttps://juser.fz-juelich.de/record/202816/files/1-s2.0-S0167273814003695-main%281%29.pdf?subformat=pdfa$$xpdfa$$yRestricted
000202816 909CO $$ooai:juser.fz-juelich.de:202816$$pVDB
000202816 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)145202$$aForschungszentrum Jülich GmbH$$b0$$kFZJ
000202816 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)140525$$aForschungszentrum Jülich GmbH$$b1$$kFZJ
000202816 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)128631$$aForschungszentrum Jülich GmbH$$b2$$kFZJ
000202816 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)128648$$aForschungszentrum Jülich GmbH$$b3$$kFZJ
000202816 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)129815$$aForschungszentrum Jülich GmbH$$b4$$kFZJ
000202816 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)129928$$aForschungszentrum Jülich GmbH$$b5$$kFZJ
000202816 9131_ $$0G:(DE-HGF)POF3-521$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Electron Charge-Based Phenomena$$x0
000202816 9141_ $$y2015
000202816 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR$$bSOLID STATE IONICS : 2013
000202816 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000202816 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000202816 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index
000202816 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000202816 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000202816 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences
000202816 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF < 5
000202816 920__ $$lyes
000202816 9201_ $$0I:(DE-Juel1)IEK-3-20101013$$kIEK-3$$lElektrochemische Verfahrenstechnik$$x0
000202816 9201_ $$0I:(DE-Juel1)PGI-9-20110106$$kPGI-9$$lHalbleiter-Nanoelektronik$$x1
000202816 9201_ $$0I:(DE-Juel1)IEK-2-20101013$$kIEK-2$$lWerkstoffstruktur und -eigenschaften$$x2
000202816 9201_ $$0I:(DE-82)080009_20140620$$kJARA-FIT$$lJARA-FIT$$x3
000202816 980__ $$ajournal
000202816 980__ $$aVDB
000202816 980__ $$aI:(DE-Juel1)IEK-3-20101013
000202816 980__ $$aI:(DE-Juel1)PGI-9-20110106
000202816 980__ $$aI:(DE-Juel1)IEK-2-20101013
000202816 980__ $$aI:(DE-82)080009_20140620
000202816 980__ $$aUNRESTRICTED
000202816 981__ $$aI:(DE-Juel1)IMD-1-20101013
000202816 981__ $$aI:(DE-Juel1)ICE-2-20101013
000202816 981__ $$aI:(DE-Juel1)PGI-9-20110106
000202816 981__ $$aI:(DE-Juel1)IEK-2-20101013