Journal Article

FZJ-2015-04977

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png XRD analysis of strain states in epitaxial YSZ/RE2O3 (RE=Y, Er) multilayers as a function of layer thickness

Keppner, J.FZJ* ; Korte, C. (Corresponding author)FZJ* ; Schubert, J.FZJ* ; Zander, W.FZJ* ; Ziegner, M.FZJ* ; Stolten, D.FZJ*

2015
Elsevier Science Amsterdam [u.a.]

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Please use a persistent id in citations: doi:10.1016/j.ssi.2014.09.012

Abstract: The strain in epitaxialmultilayerswith coherent interfaces between yttria stabilized zirconia and rare earth metaloxides is investigated as a function of the layer thickness. An analyticmodel was developed to describe the strain,which is analyzed bymeasuring distinct XRD reflections in two orientations. Applying our model to this data theinterface thickness δ0 is estimated. For Y2O3/YSZ multilayers δ0 is 9.3 nm and for Er2O3/YSZ multilayers δ0 is8.2 nm. Our findings are in accordance with the assumption that mismatch induced stress can be relaxed byelastic deformation

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Contributing Institute(s):

1. Elektrochemische Verfahrenstechnik (IEK-3)
2. Halbleiter-Nanoelektronik (PGI-9)
3. Werkstoffstruktur und -eigenschaften (IEK-2)
4. JARA-FIT (JARA-FIT)

Research Program(s):

1. 521 - Controlling Electron Charge-Based Phenomena (POF3-521) (POF3-521)

Appears in the scientific report 2015

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Database coverage:
Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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